Peer-reviewed Publications
ACE Analysis (Reliability)
A First-Order Mechanistic Model for Architectural Vulnerability Factor
Arun Arvind Nair, Stijn Eyerman, Lieven Eeckhout, and Lizy Kurian John. in the 39th International Symposium on Computer Architecture, ISCA-39 , June 2012. [ PDF ]
Acceptance rate: 18% (47/262)
AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-case Vulnerability to Soft Errors
Arun Arvind Nair, Lizy Kurian John, and Lieven Eeckhout. in the 43rd International Symposium on Microarchitecture, MICRO-43, Dec 2010 [PDF]
Acceptance rate: 18% (45/248)